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COSIC seminar – Who will fault sensors be helpful for? – Kazuo Sakiyama (The University of Electro-Communications, Tokyo)

03/11/2017 @ 14:00 - 15:00 CET

This talk consists of two topics of our recent work. The first one is about a reactive distributed on-chip sensor for detecting the laser-based fault injection attack. IC substrate potential bounce due to laser injection is in-situ monitored. Then, security evaluation of the countermeasure is introduced as the second topic. We show that due to the nature of the proposed sensor, and ineffective fault analysis is possible by observing how the sensors react to the laser fault injection.


14:00 - 15:00 CET
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ESAT auditorium C, B91.300
ESAT auditorium C, Kasteelpark Arenberg 10
Leuven, 3001 Belgium
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